Victor Khilkevich received his Ph.D. degree in electrical engineering from Moscow Power Engineering Institute, Technical University, Moscow, Russia, in 2001. He is currently a Research Professor in the Department of Electrical and Computer Engineering at Missouri S&T. His current research interests include microwave imaging, automotive electromagnetic compatibility modeling, and high-frequency measurement techniques. He is the recipient of the Missouri University of Science and Technology 2020 Faculty Achievement Award, IEEE Transactions on Electromagnetic Compatibility 2019 Distinguished Reviewer Award, and the IEEE EMC Society 2020 Technical Achievement Award.

Selected Publications

• S. Yong et al., "Dielectric Loss Tangent Extraction Using Modal Measurements and 2-D Cross-Sectional Analysis for Multilayer PCBs," in IEEE Transactions on Electromagnetic Compatibility, vol. 62, no. 4, pp. 1278-1292, Aug. 2020
• S. Shinde et al., "Radiated EMI Estimation From DC–DC Converters With Attached Cables Based on Terminal Equivalent Circuit Modeling," in IEEE Transactions on Electromagnetic Compatibility, vol. 60, no. 6, pp. 1769-1776, Dec. 2018.
• G. Shen, S. Yang, J. Sun, S. Xu, D. J. Pommerenke and V. V. Khilkevich, "Maximum Radiated Emissions Evaluation for the Heatsink/IC Structure Using the Measured Near Electrical Field," in IEEE Transactions on Electromagnetic Compatibility, vol. 59, no. 5, pp. 1408-1414, Oct. 2017.
• T. Li, V. Khilkevich and D. Pommerenke, "Phase-Resolved Near-Field Scan Over Random Fields," in IEEE Transactions on Electromagnetic Compatibility, vol. 58, no. 2, pp. 506-511, April 2016.
• P. Maheshwari, H. Kajbaf, V. V. Khilkevich and D. Pommerenke, "Emission Source Microscopy Technique for EMI Source Localization," in IEEE Transactions on Electromagnetic Compatibility, vol. 58, no. 3, pp. 729-737, June 2016.

Books

• V. Khilkevich. Artificial Neural Networks and their Application. MPEI Publishing, Moscow, Russia, 2004. (In Russian)

Selected Honors and Awards

• 2022 Transactions on EMC Distinguished Reviewer.
•  Missouri S&T 2022 Faculty Achievement Award.
• “Best SIPI Symposium Student Paper Award”. Jiangshuai Li, Yuanzhuo Liu, Liang Liu, Shengxuan Xia, Scott Hinaga, and Victor Khilkevich “Dielectric Loss Tangent Extraction Using Two Single-Ended Striplines of Different Width”. 2022 IEEE EMC+SIPI Symposium, Spokane, Washington.
• “Best EMC Symposium Student Paper Award”. Wei Zhang, Rui Mi, and Victor Khilkevich “3D Printed Multilayer Microwave Absorber. 2022 IEEE EMC+SIPI Symposium, Spokane, Washington.
• “Best EMC Symposium Student Paper Award – Honorable Mention”. James Hunter, Shengxuan Xia, Aaron Harmon, Mohamed Z.M. Hamdalla, Ahmed M. Hassan, Victor Khilkevich, and Daryl G. Beetner “A Segmentation Strategy for Structures with Common Mode Coupling”. 2022 IEEE EMC+SIPI Symposium, Spokane, Washington.
•  IEEE EMC society Technical Achievement Award 2021.
•  2019 Transactions on EMC Distinguished Reviewer.
•  Missouri S&T 2019 Faculty Achievement Award.
• “Best Symposium Student Paper Award – Honorable Mention” - G. Shen et al., "EMI control performance of the absorbing. material for application on flexible cables," 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC). Ottawa, ON, 2016, pp. 30-35.
• “Best DesignCon paper” finalist - V. Khilkevich, B. Achkir, J. Drewniak. “Improvements in time-domain TRL accuracy for transmission measurements”, DesignCon 2012. January 30 – February 2, 2012, Santa Clara, California.