DARYL BEETNER

Professor and Chair of the Electrical and Computer Engineering Department
139 Emerson Electric Co. Hall
Rolla, MO 65409-0040
Phone: 573-341-4503
Fax: 573-341-4532
daryl@mst.edu

Areas Of Interest

  • Electromagnetic immunity and emissions
  • Electromagnetic modeling
  • IC Design and modeling
  • Detection and neutralization of electronic triggers used in explosives
  • Engineering education

Bio

Daryl G. Beetner is the Department Chair and a Professor of electrical and computer engineering. He conducts research on a wide variety of topics, including electromagnetic compatibility (emissions, immunity, power integrity and modeling) at the chip and systems level and detection and neutralization of the electronics used in explosive devices.

 

Education

  • D.Sc.EE (1997) and M.S.EE (1994) from Washington University at St Louis.
  • B.S.EE (1990) from Southern Illinois University at Edwardsville.



Selected Publications

 

Journal Publications

  • C. Sui, L. Ren, X. Gao, J. Pan, J. L. Drewniak, and D. G. Beetner, “Predicting Statistical Characteristics of Jitter Due to Simultaneous Switching Noise,” IEEE Transaction on Electromagnetic Compatibility, to appear.
  • M. S. Halligan, X. Tian, X. Li, S. Connor, D. G. Beetner, J. L. Drewniak, “Quantifying High-Density Connector Radiation in a Lossy Multi-Signal Environment,” IEEE Transaction on Electromagnetic Compatibility, to appear.
  • X. Gao, C. Sui, S. Hemmady, J. Rivera, S. Yakura, L. Andivahis, D. Pommerenke, D. Beetner, “Modeling Delay Variations in CMOS Digital Logic Circuits Due to Electrical Disturbances in the Power Supply,” IEEE Transactions on Electromagnetic Compatibility, Vol. 57, No. 5, pp. 1179-87, 2015.
  • N. Bondarenko, Z. Li, B. Xu, G. Li, T. Van Doren, D. Loken, P. Berger, D. Beetner, “A Measurement-Based Model of the Electromagnetic Emissions from a Power Inverter,” IEEE Transactions on Power Electronics, Vol. 30, No. 10, pp. 5522-31, 2015.
  • C. Sui, S. Bai, T. Zhu, C. Cheng, and D. Beetner, “New Methods to Characterize Deterministic Jitter and Crosstalk-Induced Jitter From Measurements,” IEEE Transactions on Electromagnetic Compatibility, Vo. 57, No. 4, pp. 877-84, 2015.
  • G. Li, G. Hess, R. Hoeckele, S. Davidson, P. Jalbert, V. Khilkevich, T. Van Doren, D. Pommerenke, D. Beetner, “Measurement-Based Modeling and Worst-Case Estimation of Crosstalk Inside an Aircraft Cable Connector,” IEEE Transactions on Electromagnetic Compatibility, Vol. 57, No. 4, pp. 827-35, 2015.
  • G. Li, W. Qian, A. Radchenko, J. He, T. Van Doren, D. Beetner, D. Pommerenke, G. Hess, R. Hoeckele, “Prediction of Radiated Emissions from Cables Over a Metal Plane Using a SPICE Model,” IEEE Transactions on Electromagnetic Compatibility, Vol. 57, No. 1, pp. 61-8, 2015.
  • J. Zhang, X. Li, R. Moseley, D. Beetner, D. Pommerenke, “Predicting Field Coupling to an IC Using Measured Coupling Factors,” IEEE Transactions on Electromagnetic Compatibility, Vol. 56, No. 6, pp. 1287-1294, 2014.
  • J. Zhang, J. Koo, R. Moseley, S. Herrin, X. Li, D. Beetner, D. Pommerenke, “Modeling injection of Electrical Fast Transients into power and IO pins of ICs,” IEEE Transactions on Electromagnetic Compatibility, Vol. 56, No. 6, pp. 1576-84, 2014.
  • M. Halligan and D. Beetner, “Maximum Crosstalk Estimation in Lossless and Homogeneous Transmission Lines,” IEEE Transactions on Microwave Theory and Techniques, Vol. 62, No. 9, pp. 1953-61, 2014.
  • C. Stagner, D. Beetner, S. Grant, “A Comparison of Algorithms for Detecting Synchronous Digital Devices Using Their Unintended Electromagnetic Emission,” IEEE Transactions on Electromagnetic Compatibility, Vol. 56, No. 6, pp. 1304-1312, 2014.
  • M. Halligan and D. Beetner, “Maximum Crosstalk Estimation in Weakly Coupled Transmission Lines,” IEEE Transactions on Electromagnetic Compatibility, Vol. 56, No. 3, pp. 736-44, 2014.
  • M. Halligan, D. Beetner, S. Grant, “Susceptibility Study of Audio Recording Devices to Electromagnetic Stimulations,” SAND report, Sandia Nat. Lab., Albuquerque, NM, Rep. SAND2014-0560, Feb. 2014.
  • L. Ren, T. Li, S. Chandra, X. Chen, H. Bishnoi, S. Sun, P. Boyle, I. Zamek, J. Fan, D. Beetner, J. Drewniak, “Prediction of Power Supply Noise from Switching Activity in an FPGA,” IEEE Transactions on Electromagnetic Compatibility, Vol. 56, No. 3, pp. 699-706, 2014.


Book Chapters

  • D. Beetner, N. Bondarenko, S. Peng, and T. Van Doren, “Debugging of Electromagnetic Compatibility Issues”. In K. Fowler (Ed.), Managing the Development of Embedded Systems, Elsevier press. 2014.
  • C. Stanger, S. Seguin, S. Grant, D. Beetner, “Detecting Electronic Initiators Using Electromagnetic Emissions,” Cases on Research and Knowledge Discovery, C. W. Brown, K.A. Peters, & K. A. Nyarko (Eds), PA: IGI Global, 2014.


Patents

  • D. Beetner, S. Seguin, T. Hubing, “Electromagnetic Emissions Stimulation and Detection System,” Dec. 9, 2008, U.S. Patent no. 7,464,005.
  • S. A. Seguin, D. G. Beetner, T. H. Hubing, “Electromagnetic Emissions Stimulation and Detection System,” US. Patent no. 7,853,437, Dec. 14, 2010.
  • D. Beetner, A. Conrad, C. Stagner, S. Grant, S. Peng, N. Bondarenko, “Detecting Superheterodyne and Homodyne Receivers by Manipulating their Incidental RF Emissions with an External Stimulation,” invention disclosure, submitted Oct. 27, 2009, U.S. Prov. Patt App. No. 61/279,854.


Selected Awards

  • Alumni Hall of Fame award, Southern Illinois University at Edwardsville, 2015.
  • Best Paper Award, Power Integrity and Signal Integrity, DesignCon 2015 (national award).
  • Faculty Excellence Award, Missouri University of Science & Tech, 2008, 2003.
  • Multiple Teaching commendations, where teacher ratings were high enough to qualify for the Outstanding Teaching Award but number of courses taught over the year were too low
  • Finalist for Best Paper Award, 2008 IEEE International Symposium on Electromagnetic Compatibility, August 2008.
  • Finalist for Best Paper Award, DesignCon, Feb. 2008.
  • C. Holmes MacDonald Outstanding Young Electrical Engineering Professor, 2003.The IEEE St Louis Section Outstanding Faculty Award, 2001
  • Senior Member IEEE, 2003.
  • Registered Professional Engineer in the state of Missouri, 2002-present.


Resume

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